ÖZELLİKLER

• Wide dynamic range and high-speed measurement at optical receiver bandwidths used commonly by customers within production lines for optical active devices
  • SMSR measurement at 45 dB minimum
  • Maximum measurement processing time^*1 of 0.35s (sweeping 30-nm wavelength)
• Facilitates Stable Production of High-output LDs
  • ±1.4 dB SMSR reproducibility^*2
• Same key functions and performance as predecessor, supporting various production-line environments
  • Wide wavelength band (600 nm to 1750 nm) for evaluating all optical active devices
  • Nine application menus for LD-module, WDM, etc., measurements